NFC

Große Auswahl an NFC- und ISO-Triggern, individuelle Hüllkurvenberechnung und NFC-/ISO-Messfunktionen erleichtern Auswertung analoger NFC-Signale und somit die Entwicklung und Integration von NFC-fähigen Geräten

Die mit dem SESAMES Award ausgezeichnete Software zur Designvalidierung von NFC-Geräten – das Design Validation Center – ist um ein weiteres einzigartiges Feature, ein NFC-Oszilloskop, erweitert worden. Dieses ist mit dem Design Validation Center R1.1 ab sofort verfügbar.

Das Besondere an dem Oszilloskop ist die große Auswahl an vielseitigen NFC- und ISO-Triggern, mit deren Hilfe sich Probleme auf analoger und digitaler Ebene in der Kommunikation gezielt finden lassen. „Der Trigger kann dabei auf unterschiedlichsten Schichten konfiguriert werden. Möglich ist ein Trigger zum Beispiel auf Carrier Modulation, NFC Frame Start/End, Decoder I/O Collision oder auch auf Kommandos wie WUPA, um nur einige von über 100 Triggerbedingungen zu nennen. Das gibt es bei keinem anderen Oszilloskop,“ erklärt Ralph Kamp, Business Development Manager von COMPRION. Die Hüllkurvenberechnung ist zudem konfigurierbar und lässt sich direkt anzeigen. Damit lassen sich mit dem Oszilloskop Messungen nach NFC, EMVCo oder ISO ganz einfach durchführen.

In nur 2 Schritten zum Messergebnis

COMPRION introduces their new product line for NFC development testing that helps identifying and resolving error causes in NFC communication at an early stage.

On the Embedded World, February 27 – March 1, in Nuremberg, COMPRION – a provider of test solutions – is going to launch their latest product line for NFC testing, the CL Development Line. It can be used for validating the interface design, for preparing the certification, for functional testing, and for verifying interoperability.

NFC problems? Do they still exist?

COMPRION has won the SESAMES Award 2017 in the category “Manufacturing & Test” for Design Validation Center with Vector Field Probe. This is a new test solution for the validation of contactless interface design in the development phase of an NFC-based product. The award highlights COMPRION’s expertise in developing innovative solutions.

Hajo Sandschneider, Marketing Director, is pleased about this award, “We are proud to receive this award as it underpins our leading position in testing the contactless technology of the future. The integrated, unprecedented vector field measurement probe visualizes signal information in a completely new way. It helps to tune signal characteristics perfectly to the final operation conditions and the anticipated user behavior. This speeds up the development of NFC-based services enormously.”

Unprecedented vector field measurement visualizes signal information in a completely new way

As of today, integrators of NFC modules can shorten development phases of NFC products drastically by using the Design Validation Platform that helps to tune signal characteristics perfectly to the final operation conditions and the anticipated user behavior.

“Design Validation Platform is the only system on the market that uses calibrated measurement instruments to automatically detect field characteristics of contactless products with all direction components. 3D visualization of the direction of the magnetic lines as well as 2D or 3D representations of the field strength, so called “heatmaps“ reduce analysis efforts. Available solutions so far do not integrate the direction of the contactless field. The Vector Field Probe, a special antenna, detects the x-, y-, and z-components of the magnetic field thus creating a complete representation in a single measurement,“ emphasizes Hajo Sandschneider, Marketing Director with COMPRION. “The contactless reader of a door lock, for example, has a very small magnetic field that is additionally affected by the metal of the door knob, thus creating problems when opening. Our new measurement solution makes it possible to draw conclusions for optimization faster and more systematically,” Sandschneider explains.

New solution with unique vector field probe helps to optimize design of contactless readers from the very beginning

The Design Validation Platform, a new COMPRION test solution that enables manufacturers and integrators of NFC readers to validate their implementation early in the development phase, is short-listed for the SESAMES Awards. The awards are part of the TRUSTECH show in Cannes, showcasing the best innovations in the trust-based tech industry. The winners of the awards will be presented on November 28–29, 2017, in Cannes, at the Palais des Festivals on the French Riviera.

100% of respective test cases have been validated and henceforth ensure conformity of terminals with GSMA standards for UICC-based NFC services.

During the recent GCF CAG#52 October meeting in Venice, the new work item 249 was activated. This was possible because 100% of the contained test cases were validated on COMPRION test systems. “The work item covers several technologies such as card emulation, Bearer Independent Protocol (BIP), general device support, and Android-specific device support,“ says Hajo Sandschneider, Marketing Director at COMPRION. “The referenced test cases are defined in the GSMA TS.27 NFC Handset Test Book. We are proud that 100% of the conformance test cases were validated by GCF so that work item 249 UICC based NFC Services (Rel-9) could be activated.” The new work item extends the test coverage for NFC-related conformance certification criteria in accordance with the conformance test cases defined in various chapters of the GSMA TS.27 document.

The newly added test cases reached 100% validation on the COMPRION UT³ Platform listed as TP 118. UT³ Platform is COMPRION's universal conformance platform for contact-based and contactless terminal testing.

For further in-depth information visit https://www.comprion.com/testability/news-details/news/new-validated-com...