COMPRION introduces their new product line for NFC development testing that helps identifying and resolving error causes in NFC communication at an early stage.
On the Embedded World, February 27 – March 1, in Nuremberg, COMPRION – a provider of test solutions – is going to launch their latest product line for NFC testing, the CL Development Line. It can be used for validating the interface design, for preparing the certification, for functional testing, and for verifying interoperability.
NFC problems? Do they still exist?